Published 1997 | Version v1
Journal article

The x-rays fluorescence applied to the analysis of alloys

  • 1. Instituto Tecnologico de Costa Rica (Costa Rica). Departamento de Fisica

Description

This work is based on the utilization of the Fluorescence of X Rays. This technique of non destructive trial, has the purpose to establish a routine method, for the control of the conformation of industrial samples used. It makes an analysis with a combination of the algorithms of Rasberry-Heinrich and Claisse-Thinh. Besides, the numerical implementation of non usual techniques in this type of analysis. Such as the Linear Programming applied to the solution of super determined systems, of equations and the utilization of methods of relaxation to facilitate the convergence to the solutions. (author)

Availability note (English)

Available from Biblioteca Luis Demetrio Tinoco, Universidad de Costa Rica

Abstract (Spanish)

Este trabajo se basa en la utilizacion de la Fluorescencia de Rayos X, tecnica de ensayo no destructivo, con el proposito de establecer un metodo rutinario para el control de la composicion de muestras de uso industrial. Se ensaya para el analisis una combinacion de los algoritmos de Rabsberry-Heinrich y Claisse-Thinh, ademas de la implementacion de tecnicas numericas no acostumbradas en este tipo de analisis, como lo son la Programacion Lineal aplicada a la solucion de sistemas superdeterminados de ecuaciones y la utilizacion de metodos de relajacion para facilitar la convergencia a las soluciones. (author)

Additional details

Additional titles

Original title (Spanish)
La fluorescencia de rayos x aplicada al analisis de aleaciones

Publishing Information

Journal Title
Tecnologia en marcha
Journal Volume
13
Journal Issue
special issue
Journal Page Range
p. 19-27
ISSN
0379-3982

INIS

Country of Publication
Costa Rica
Country of Input or Organization
Costa Rica
INIS RN
31039303
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Numerical Data
Descriptors DEI
ALGORITHMS; ALLOYS; EQUATIONS; LINEAR PROGRAMMING; NUMERICAL DATA; RELAXATION; SAMPLING; X-RAY FLUORESCENCE ANALYSIS
Descriptors DEC
CHEMICAL ANALYSIS; DATA; INFORMATION; MATHEMATICAL LOGIC; NONDESTRUCTIVE ANALYSIS; PROGRAMMING; X-RAY EMISSION ANALYSIS

Optional Information

Notes
Refs, figs, tabs.