Multiple scattering approach to photoemission from the highest occupied molecular orbital of pentacene
- 1. Graduate School of Advanced Integration Science, Chiba University, Chiba 263-8522 (Japan)
- 2. INFN Laboratori Nazionali di Frascati, Via E Fermi 40, c.p. 13, I-00044 Frascati (Italy)
- 3. Physics Division, School of Science and Technology, Università di Camerino, via Madonna delle Carceri 9, I-62032 Camerino (Italy)
- 4. Département Matéiaux Nanosciences, Institut de Physique de Rennes, UMR UR 1-CNRS 6251, Université de Rennes 1, 35042 Rennes Cedex (France)
Description
Angle resolved photoemission spectroscopy (ARPES) gives detailed information about the surface electronic structures and oriented molecules. In the so-called orbital tomography method, the ARPES intensity is obtained by a simple Fourier transform of the initial state molecular orbital. While this method has given good results for a number of π-orbital systems, it is known to have strong limitations because the final state is approximated as a plane wave and thus photoelectron scattering is completely neglected. Here we propose an ARPES theory where the initial states are taken from a quantum chemistry method and the final states are calculated in multiple scattering theory. The initial molecular orbitals are reexpanded in a multi-site spherical wave basis and the multiple scattering potential is constructed from the ab initio charge density. These computations are performed algebraically using newly developed algorithms. The method is applied to pentance and the results are compared with the plane wave approximation.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.elspec.2017.04.002Additional details
Identifiers
- DOI
- 10.1016/j.elspec.2017.04.002;
- PII
- S0368-2048(17)30070-1;
Publishing Information
- Journal Title
- Journal of Electron Spectroscopy and Related Phenomena
- Journal Volume
- 220
- Journal Page Range
- p. 21-24
- ISSN
- 0368-2048
- CODEN
- JESRAW
Conference
- Title
- 39. international conference on vacuum ultraviolet and X-ray physics
- Acronym
- VUVX-2016
- Dates
- 3-8 Jul 2016
- Place
- Zurich (Switzerland)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49050818
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S73: NUCLEAR PHYSICS AND RADIATION PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHARGE DENSITY; ELECTRONIC STRUCTURE; FOURIER TRANSFORMATION; MOLECULAR ORBITAL METHOD; MULTIPLE SCATTERING; MULTIPLICITY; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; SPHERICAL CONFIGURATION; WAVE PROPAGATION
- Descriptors DEC
- CALCULATION METHODS; CONFIGURATION; ELECTRON SPECTROSCOPY; EMISSION; INTEGRAL TRANSFORMATIONS; SCATTERING; SECONDARY EMISSION; SPECTROSCOPY; TRANSFORMATIONS
Optional Information
- Copyright
- Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.