High Resolution Image with Multi-wall Carbon Nano tube Atomic Force Microscopy Tip

In this paper, a simple and reproducible approach for attaching the multi-wall carbon nano tubes to the apex of the atomic force microscope probe has been proposed. For this purpose, the dielectrophoresis method was applied due to its simple performance, cheapness and reliability. Here, specifically the effect of voltage on the deposition of multi-wall carbon nano tubes onto the tip of the atomic force microscope has been investigated while the other parameters held constant. Our experiments revealed that when the frequency was held at 5 MHz and 1 μL of multi-wall carbon nano tubes solution injected, the optimum voltage between tip and electrode surface was 6 V.