Decoration of swift heavy ion tracks in nickel-oxide with gold atoms
Creators
Description
We have investigated the swift heavy ion beam induced relocation of Au marker layers in NiO. It was found that, above a certain threshold value, the electronic energy deposition results in gettering of the nearby Au atoms into the latest excited ion track. In that way a continuous Au redistribution from a recent track into a new one occurs. For Kr-ions only short and partly segmented Au-containing cylinders of about 5 nm in diameter are found, which are symmetrically located around the initial marker plane. In beam direction the laterally averaged Au distribution shows a slight broadening, which saturates at relatively low fluences. In case of Xe- and Au-ions coherent cylindrical Au-decorated zones are formed which reach up to the surface, and which obviously allow for transversal Au transport towards the surface and for segregation of the Au in spherical nano-particles on top of the surface. The transversal transport mechanism is not of diffusion-like nature, but most probably by pressure induced viscous flow in the molten ion track
Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2003.12.093;
- PII
- S0168583X03023000;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 218
- Journal Issue
- 4
- Journal Page Range
- p. 479-486
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 12. international conference on radiation effects in insulators
- Dates
- 31 Aug - 5 Sep 2003
- Place
- Gramado (Brazil)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Pakistan
- INIS RN
- 35078006
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- GOLD IONS; HEAVY IONS; INTERFACES; ION BEAMS; KRYPTON IONS; NICKEL OXIDES; PARTICLE TRACKS; PRECIPITATION; SURFACE COATING; THIN FILMS; XENON IONS
- Descriptors DEC
- BEAMS; CHALCOGENIDES; CHARGED PARTICLES; DEPOSITION; FILMS; IONS; NICKEL COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; SEPARATION PROCESSES; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.