Published June 2004 | Version v1
Journal article

Decoration of swift heavy ion tracks in nickel-oxide with gold atoms

Description

We have investigated the swift heavy ion beam induced relocation of Au marker layers in NiO. It was found that, above a certain threshold value, the electronic energy deposition results in gettering of the nearby Au atoms into the latest excited ion track. In that way a continuous Au redistribution from a recent track into a new one occurs. For Kr-ions only short and partly segmented Au-containing cylinders of about 5 nm in diameter are found, which are symmetrically located around the initial marker plane. In beam direction the laterally averaged Au distribution shows a slight broadening, which saturates at relatively low fluences. In case of Xe- and Au-ions coherent cylindrical Au-decorated zones are formed which reach up to the surface, and which obviously allow for transversal Au transport towards the surface and for segregation of the Au in spherical nano-particles on top of the surface. The transversal transport mechanism is not of diffusion-like nature, but most probably by pressure induced viscous flow in the molten ion track

Additional details

Identifiers

DOI
10.1016/j.nimb.2003.12.093;
PII
S0168583X03023000;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
218
Journal Issue
4
Journal Page Range
p. 479-486
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
12. international conference on radiation effects in insulators
Dates
31 Aug - 5 Sep 2003
Place
Gramado (Brazil)

INIS

Country of Publication
Netherlands
Country of Input or Organization
Pakistan
INIS RN
35078006
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
GOLD IONS; HEAVY IONS; INTERFACES; ION BEAMS; KRYPTON IONS; NICKEL OXIDES; PARTICLE TRACKS; PRECIPITATION; SURFACE COATING; THIN FILMS; XENON IONS
Descriptors DEC
BEAMS; CHALCOGENIDES; CHARGED PARTICLES; DEPOSITION; FILMS; IONS; NICKEL COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; SEPARATION PROCESSES; TRANSITION ELEMENT COMPOUNDS

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.