Published 1995
| Version v1
Book
Effect of MeV Au ion implantation on the composition of GaAs: PIXE and XRF studies
- 1. Institute of Physics, Bhubaneswar (India)
Description
Short communication
Additional details
Publishing Information
- Publisher
- Department of Atomic Energy.
- Imprint Place
- Mumbai (India)
- Imprint Title
- Proceedings of the DAE solid state physics symposium. V. 38C
- Imprint Pagination
- 545 p.
- Journal Page Range
- p. 167.
Conference
- Title
- 38. DAE solid state physics symposium.
- Dates
- 27-31 Dec 1995.
- Place
- Calcutta (India).
INIS
- Country of Publication
- India
- Country of Input or Organization
- India
- INIS RN
- 28063183
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- ANNEALING; GALLIUM ARSENIDES; GOLD IONS; ION IMPLANTATION; MEV RANGE 01-10; PIXE ANALYSIS; VACANCIES; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- ARSENIC COMPOUNDS; ARSENIDES; CHARGED PARTICLES; CHEMICAL ANALYSIS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ENERGY RANGE; GALLIUM COMPOUNDS; HEAT TREATMENTS; IONS; MEV RANGE; NONDESTRUCTIVE ANALYSIS; PNICTIDES; POINT DEFECTS; X-RAY EMISSION ANALYSIS