Published August 22, 2003 | Version v1
Journal article

Electric measurements of nano-scaled devices

Description

Molecular electronics has been wished to be the real one for many researchers. In this paper, we report the electric properties of nano-scaled transistors using a triple-probe atomic force microscope. First, we describe the electric properties of semiconductive carbon nanotube (CNT) rings and metallic ones. The semiconductive small CNT ring connected with CNT terminals can be used for a nano-scaled transistor with size of less than 20 nm. Next, we also fabricated a single DNA molecule device to measure its electric properties as a filed effect transistor. Last, we show the electric conductivity of a single DNA molecule. These results show that the triple-probe atomic force microscope would be a powerful tool for molecular electronics

Additional details

Identifiers

DOI
10.1016/S0040-6090;
PII
S004060900300806X;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
438-439
Journal Issue
1-2
Journal Page Range
p. 462-466
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
5. international conference on nano-molecular electronics
Dates
10-12 Dec 2002
Place
Kobe (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37013531
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ATOMIC FORCE MICROSCOPY; CARBON; DNA; ELECTRIC CONDUCTIVITY; NANOTUBES; TRANSISTORS
Descriptors DEC
ELECTRICAL PROPERTIES; ELEMENTS; MICROSCOPY; NANOSTRUCTURES; NONMETALS; NUCLEIC ACIDS; ORGANIC COMPOUNDS; PHYSICAL PROPERTIES; SEMICONDUCTOR DEVICES

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.