Published August 22, 2003
| Version v1
Journal article
Electric measurements of nano-scaled devices
Description
Molecular electronics has been wished to be the real one for many researchers. In this paper, we report the electric properties of nano-scaled transistors using a triple-probe atomic force microscope. First, we describe the electric properties of semiconductive carbon nanotube (CNT) rings and metallic ones. The semiconductive small CNT ring connected with CNT terminals can be used for a nano-scaled transistor with size of less than 20 nm. Next, we also fabricated a single DNA molecule device to measure its electric properties as a filed effect transistor. Last, we show the electric conductivity of a single DNA molecule. These results show that the triple-probe atomic force microscope would be a powerful tool for molecular electronics
Additional details
Identifiers
- DOI
- 10.1016/S0040-6090;
- PII
- S004060900300806X;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 438-439
- Journal Issue
- 1-2
- Journal Page Range
- p. 462-466
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- 5. international conference on nano-molecular electronics
- Dates
- 10-12 Dec 2002
- Place
- Kobe (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37013531
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CARBON; DNA; ELECTRIC CONDUCTIVITY; NANOTUBES; TRANSISTORS
- Descriptors DEC
- ELECTRICAL PROPERTIES; ELEMENTS; MICROSCOPY; NANOSTRUCTURES; NONMETALS; NUCLEIC ACIDS; ORGANIC COMPOUNDS; PHYSICAL PROPERTIES; SEMICONDUCTOR DEVICES
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.