Optical characterization of isotropic and anisotropic layered media

This work deals with the interaction of electromagnetic radiation in the UV/IR region with layered media and the inversion of photometric and ellipsometric spectra. A method is presented how to calculate the dielectric function of an ensemble of different anisotropic oscillators. A way is proposed how to extract both components of the dielectric tensor of uniaxial oligomers out of spectroscopic measurements at normal incidence, if it is possible to make two different structural modifications of the oligomer. Then, effective medium theories with an expansion on anisotropic media are treated and the result is used to model the optical properties of the rough surface of an organic thin film. Further, a new unified analytical inversion of reflectometric and ellipsometric data of strongly absorbing media is presented. A method is shown how to calculate simultaneously the thickness and the optical constants of weakly absorbing films out of one spectroscopic reflection or transmission measurement. The last topic are the electromagnetic properties of one-dimensional photonic crystals. The dependence of the spectral position of band edges on the angle of incidence and the polarization is investigated as well as the sensitivity to thickness variations. At last, an analytical approximation to calculate the influence of local defects in the perfect crystal is presented. (author)