Chemical and electrical properties of (NH4)2S passivated GaSb surface
Creators
- 1. Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083 (China)
Description
The surface chemical properties of gallium antimonide (GaSb) after ammonium sulfide ((NH4)2S) solution passivation have been studied by X-ray photoelectron spectroscopy (XPS), time of flight secondary ion mass spectroscopy (TOF-SIMS) and I–V measurement. An advantage of neutral (NH4)2S + S solution over pure (NH4)2S solution and alkaline (NH4)2S + S solution has been found in the ability to passivate the GaSb surface by contrast and comparison. It has been found that alkaline (NH4)2S + S solution passivation effectively removes oxides of the GaSb surface and forms sulfide products to improve device performance. TOF-SIMS complementally demonstrates that pure (NH4)2S passivation did form sulfide products, which are too soluble to really exist. The lowest roughness determined using a 3D optical profilometer and the highest improved SBD quality proved that neutral (NH4)2S + S solution passivation worked much better in improving the surface properties of GaSb. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1674-4926/36/7/073006Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Semiconductors
- Journal Volume
- 36
- Journal Issue
- 7
- Journal Page Range
- [5 p.]
- ISSN
- 1674-4926
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47089329
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CHEMICAL PROPERTIES; COMPARATIVE EVALUATIONS; ELECTRICAL PROPERTIES; GALLIUM; GALLIUM ANTIMONIDES; ION MICROPROBE ANALYSIS; MASS SPECTROSCOPY; OXIDES; PASSIVATION; SOLUTIONS; SULFIDES; SURFACES; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- ANTIMONIDES; ANTIMONY COMPOUNDS; CHALCOGENIDES; CHEMICAL ANALYSIS; DISPERSIONS; ELECTRON SPECTROSCOPY; ELEMENTS; EVALUATION; GALLIUM COMPOUNDS; HOMOGENEOUS MIXTURES; METALS; MICROANALYSIS; MIXTURES; NONDESTRUCTIVE ANALYSIS; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; PNICTIDES; SPECTROSCOPY; SULFUR COMPOUNDS