Published July 2015 | Version v1
Journal article

Chemical and electrical properties of (NH4)2S passivated GaSb surface

  • 1. Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083 (China)

Description

The surface chemical properties of gallium antimonide (GaSb) after ammonium sulfide ((NH4)2S) solution passivation have been studied by X-ray photoelectron spectroscopy (XPS), time of flight secondary ion mass spectroscopy (TOF-SIMS) and I–V measurement. An advantage of neutral (NH4)2S + S solution over pure (NH4)2S solution and alkaline (NH4)2S + S solution has been found in the ability to passivate the GaSb surface by contrast and comparison. It has been found that alkaline (NH4)2S + S solution passivation effectively removes oxides of the GaSb surface and forms sulfide products to improve device performance. TOF-SIMS complementally demonstrates that pure (NH4)2S passivation did form sulfide products, which are too soluble to really exist. The lowest roughness determined using a 3D optical profilometer and the highest improved SBD quality proved that neutral (NH4)2S + S solution passivation worked much better in improving the surface properties of GaSb. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1674-4926/36/7/073006

Additional details

Publishing Information

Journal Title
Journal of Semiconductors
Journal Volume
36
Journal Issue
7
Journal Page Range
[5 p.]
ISSN
1674-4926