Effect of annealing on the secondary particles emission from the zirconium alloy surface

The emission of secondary ions and excited particles under ion bombardment of the zirconium alloy (metallic glass) was studied by methods of secondary ion mass spectrometry (SIMS) and ion-photon spectrometry (IPS). It was ascertained that the dependence of the secondary particles yield on the radiation dose (up to 3.5 · 10¹⁷ ion centre dot cm^-2) is different for the particles knocked out from the chemical compounds surface and for those knocked out from the target volume. It is shown that the spatial distribution of the secondary excited particles the amorphous metallic glass differs from that for the crystalline glass. From the analysis of the effect of resonant ionization process on the probability flying off of the excited particles, the work function of the bulk metallic glasses Zr₄₁Ti₁₄Cu_12.5Ni₁₀Be_22.5 (3.93 < ? < 4.131 eV) was estimated.