Published April 1, 2008
| Version v1
Journal article
Time-resolved optical emission spectroscopy of pulsed RF plasmas with copper magnetron sputtering
- 1. Division of Energy Systems Research, Ajou University, Suwon (Korea, Republic of)
- 2. CAPST, Sungkyunkwan University, Suwon (Korea, Republic of)
Description
Time-resolved optical emission spectroscopy is used to investigate the discharge of the RF pulse sputtering of copper. The time integrated emission of a neutral copper atom in RF pulse sputtering was found to be superior to emission in continuous mode. The increase stemmed from the concentration of the power in the sharp pulse at the breakdown of the discharge. The integrated emission reached its maximum at 50% duty ratio. A sudden drop in the copper emission in continuous mode from that of a 98% duty ratio was correlated with an absence of the power peak of the pulse mode
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2007.08.017Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2007.08.017;
- PII
- S0040-6090(07)01412-5;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 516
- Journal Issue
- 11
- Journal Page Range
- p. 3460-3463
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- International symposium on dry process
- Acronym
- DPS 2006
- Dates
- 29-30 Nov 2006
- Place
- Nagoya (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39071145
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COPPER; EMISSION SPECTROSCOPY; MAGNETRONS; PLASMA; PULSES; SPUTTERING; TIME RESOLUTION
- Descriptors DEC
- ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; METALS; MICROWAVE EQUIPMENT; MICROWAVE TUBES; RESOLUTION; SPECTROSCOPY; TIMING PROPERTIES; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.