Influence of defect distribution on the reducibility of CeO2−x nanoparticles
Creators
- 1. Dipartimento FIM, Università di Modena e Reggio Emilia, via G. Campi 213/a, I-41125 Modena (Italy)
- 2. CNR-NANO, via G. Campi 213/a, I-41125 Modena (Italy)
- 3. CNR-IMEM, Parco Area delle Scienze 37/A, I-43100 Parma (Italy)
- 4. EMAT, University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerp (Belgium)
Description
Ceria nanoparticles (NPs) are fundamental in heterogeneous catalysis because of their ability to store or release oxygen depending on the ambient conditions. Their oxygen storage capacity is strictly related to the exposed planes, crystallinity, density and distribution of defects. In this work a study of ceria NPs produced with a ligand-free, physical synthesis method is presented. The NP films were grown by a magnetron sputtering based gas aggregation source and studied by high resolution- and scanning-transmission electron microscopy and x-ray photoelectron spectroscopy. In particular, the influence of the oxidation procedure on the NP reducibility has been investigated. The different reducibility has been correlated to the exposed planes, crystallinity and density and distribution of structural defects. The results obtained in this work represent a basis to obtain cerium oxide NP with desired oxygen transport properties. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-4484/27/42/425705Additional details
Identifiers
Publishing Information
- Journal Title
- Nanotechnology (Print)
- Journal Volume
- 27
- Journal Issue
- 42
- Journal Page Range
- [8 p.]
- ISSN
- 0957-4484
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 50039310
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- CERIUM OXIDES; DENSITY; DISTRIBUTION; MAGNETRONS; NANOPARTICLES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CERIUM COMPOUNDS; CHALCOGENIDES; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELECTRON TUBES; ELECTRONIC EQUIPMENT; EQUIPMENT; FILMS; MICROSCOPY; MICROWAVE EQUIPMENT; MICROWAVE TUBES; OXIDES; OXYGEN COMPOUNDS; PARTICLES; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; RARE EARTH COMPOUNDS; SPECTROSCOPY