The Comparison of Optical Properties Between Ba0.25Sr0.75TiO3 and Ba0.75Sr0.25TiO3 Thin Films As The Light Sensors Application
Creators
- 1. Institut Teknologi Sepuluh Nopember Surabaya - ITS (Indonesia)
- 2. Hang Tuah University, Surabaya (Indonesia)
Description
An investigation has been carried out to determine the optical properties of Barium Strontium Titanate (BST) thin films, with different chemical composition, namely Ba0.25Sr0.75TiO3 and Ba0.75Sr0.25TiO3. BST thin films that were prepared by the Chemical Solution Deposition (CSD) method and was coated on an Indium Tin Oxide (ITO) substrate using the Spin Coating method at a speed of 3000 rpm for 30 seconds. BST thin films have been characterized using optical microscopy, UV-vis spectrophotometer and X-Ray Diffraction (XRD). The results obtained that the thickness of BST thin films with the composition of Ba0.25Sr0.75TiO3 and Ba0.75Sr0.25TiO3 were 42.7 μm and 28.152 μm respectively, the refractive index value of 2.31 and 2.30 respectively, and they had the gap energy of 3.4 eV and 3.3 eV respectively. From the data obtained data with notes using the same method and treatment, thin film with the chemical structure composition of Ba0.75Sr0.25TiO3 was declared superior for the usageas photodiode sensors. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/1825/1/012079Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 1825
- Journal Issue
- 1
- Journal Page Range
- [6 p.]
- ISSN
- 1742-6596
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53079269
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S47: OTHER INSTRUMENTATION;
- Descriptors DEI
- CHEMICAL COMPOSITION; COATINGS; INDIUM; OPTICAL MICROSCOPY; PHOTODIODES; REFRACTIVE INDEX; SENSORS; SPECTROPHOTOMETERS; SPIN; SPIN-ON COATING; STRONTIUM; SUBSTRATES; THICKNESS; THIN FILMS; TIN OXIDES; TITANATES; X-RAY DIFFRACTION
- Descriptors DEC
- ALKALINE EARTH METALS; ANGULAR MOMENTUM; CHALCOGENIDES; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; DIMENSIONS; ELEMENTS; FILMS; MEASURING INSTRUMENTS; METALS; MICROSCOPY; OPTICAL PROPERTIES; OXIDES; OXYGEN COMPOUNDS; PARTICLE PROPERTIES; PHYSICAL PROPERTIES; SCATTERING; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SURFACE COATING; TIN COMPOUNDS; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS