Electronic focalization with annular probes

The difficulties of realization and implementation of probes focalized with lens for the examination with incidence of thick cylindrical parts induced FRAMATOME to study annular probes and a variable electronic focalization system. This system is the interface between the probe and a standard control/device (apparatus). The first results are presented and commented. The use of focalized beam for the examination of circular and thick welds requires the use of several probes to cover the whole thickness of the part. These probes which focalize under cylindrical surface must have two different curvature radius in the incidence plane and perpendicular sagittal plane