Identification of the multiscale diamond turning signature of optical lens surfaces
Creators
- 1. Arts and Metiers ParisTech, LMPF, rue St Dominique - BP 508, 51006 Chalons-en-Champagne (France)
- 2. Ecole Centrale de Lyon, LTDS UMR CNRS 5513, 36 avenue Guy de Collongue, 69131 Ecully Cedex (France)
- 3. Essilor international, 81 boulevard Jean-Baptiste Oudry 94000 Creteil (France)
Description
Functional surfaces of optical lens are commonly achieved by a multi-stage diamond turning. This high precision process acts in a wide range of wavelength and allows producing 3-dimensional free form optical surfaces with excellent surface finish that meets application requirements. However, the relationships between process variables and surface characteristics are not yet predictable. In this paper, the concept of the multiscale process signature (MPS) is applied to track the effect of diamond turning process variables (cutting velocity, feed rate, cutting depth, tool roughness,...) on the surface topography from micro-roughness to waviness. The MPS is developed based on continuous wavelet transform and it depicts the essential changes of the surface state produced on the original surface after diamond turning. Using this concept, the effects of different working variables are isolated and theirs active wavelength bands were identified.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/311/1/012024Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 311
- Journal Issue
- 1
- Journal Page Range
- [6 p.]
- ISSN
- 1742-6596
Conference
- Title
- 13. international conference on metrology and properties of engineering surfaces
- Dates
- 12-15 Apr 2011
- Place
- Twickenham (United Kingdom)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43071442
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCURACY; CUTTING; DEPTH; DIAMONDS; ENGINEERING; LENSES; ROUGHNESS; SURFACES; TOOLS; TOPOGRAPHY; WAVELENGTHS
- Descriptors DEC
- CARBON; DIMENSIONS; ELEMENTS; EQUIPMENT; MACHINING; MINERALS; NONMETALS; SURFACE PROPERTIES