Published December 1993
| Version v1
Book
Measurement of depth of ions implanted in wheat seeds using SEM-EDAX
- 1. Lanzhou Univ. (China)
- 2. Academia Sinica, Lanzhou (China). Inst. of Modern Physics
Description
no abstract available
Additional details
Additional titles
- Augmented title (English)
- SEM stands for Scanning Electron Microscopy; EDAX stands for Energy Dispersive Analysis of X-ray
Publishing Information
- Publisher
- Atomic Energy Press
- Imprint Place
- Beijing (China)
- ISBN
- 7-5022-0983-2
- Imprint Title
- Institute of Modern Physics, Academia Sinica annual report (1992, January-December)
- Imprint Pagination
- 180 p.
- Journal Page Range
- p. 122-123
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 29060346
- Subject category
- S63: RADIATION, THERMAL, AND OTHER ENVIRONMENTAL POLLUTANT EFFECTS ON LIVING ORGANISMS AND BIOLOGICAL MATERIALS;
- Resource subtype / Literary indicator
- No Abstract
- Descriptors DEI
- EMBRYOS; ENERGY LOSSES; ION IMPLANTATION; IRON IONS; KEV RANGE 100-1000; PENETRATION DEPTH; SCANNING ELECTRON MICROSCOPY; SEEDS; WHEAT; X-RAY EMISSION ANALYSIS
- Descriptors DEC
- CEREALS; CHARGED PARTICLES; CHEMICAL ANALYSIS; ELECTRON MICROSCOPY; ENERGY RANGE; GRAMINEAE; IONS; KEV RANGE; LILIOPSIDA; MAGNOLIOPHYTA; MICROSCOPY; NONDESTRUCTIVE ANALYSIS; PLANTS