Phase contrast imaging with coherent high energy X-rays
Description
X-ray imaging concern high energy domain (>6 keV) like a contact radiography, projection microscopy and tomography is used for many years to discern the features of the internal structure non destructively in material science, medicine and biology. In so doing the main contrast formation is absorption that makes some limitations for imaging of the light density materials and what is more the resolution of these techniques is not better than 10-100 μm. It was turned out that there is now way in which to overcome 1μm or even sub-μm resolution limit except phase contrast imaging. It is well known in optics that the phase contrast is realised when interference between reference wave front and transmitted through the sample take place. Examples of this imaging are: phase contrast microscopy suggested by Zernike and Gabor (in-line) holography. Both of this techniques: phase contrast x-ray microscopy and holography are successfully progressing now in soft x-ray region. For imaging in the hard X-rays to enhance the contrast and to be able to resolve phase variations across the beam the high degree of the time and more importantly spatial coherence is needed. Because of this it was reasonable that the perfect crystal optics was involved like Bonse-Hart interferometry, double-crystal and even triple-crystal set-up using Laue and Bragg geometry with asymmetrically cut crystals
Additional details
Publishing Information
- Imprint Title
- Proceedings of the workshop on high resolution computed microtomography (CMT)
- Imprint Pagination
- 437 p.
- Journal Page Range
- p. 137-164.
- Report number
- LBNL--40112
Conference
- Title
- Workshop on x-ray computed microtomography (CMT).
- Dates
- 12-13 Aug 1996.
- Place
- Berkeley, CA (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 29013032
- Subject category
- S42: ENGINEERING; S62: RADIOLOGY AND NUCLEAR MEDICINE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COMPUTERIZED TOMOGRAPHY; ELECTRON MICROSCOPES; EVALUATION; MEASURING INSTRUMENTS; OPTICAL SYSTEMS; SYNCHROTRON RADIATION SOURCES; TECHNOLOGY ASSESSMENT; X-RAY DIFFRACTION; X-RAY RADIOGRAPHY
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; MICROSCOPES; RADIATION SOURCES; SCATTERING; TOMOGRAPHY
Optional Information
- Secondary number(s)
- CONF-9608146--.