Development and Characterization of a 64 Channel DAQ System for X-ray Imaging

In X-ray imaging systems, semiconductor detectors, such as CdTe and CdZnTe (CZT), are used for radiation detection because of their good energy resolution at room temperature. Spatial resolution is also better than scintillating materials, because can be made by using tens μm semiconductor process [2-3]. For X-ray imaging, we develop a 64 channels digital data acquisition (DAQ) system which is composed of CdTe array sensor and a FPGA based DAQ system. For increasing convenience of user, we developed software based of Windows OS. We also developed imaging formation algorithm for high resolution imaging results. In this paper, the status and test results of 64 channels DAQ system for X-ray imaging are addressed. In this experiment, we test 64 channels DAQ system for X-ray imaging. Imaging software based on window OS and image formation algorithm are developed for obtaining high resolution X-ray image. The developed 64 channels DAQ systems and image formation algorithm are tested by using X-ray and Z-shape object.