Published 1997
| Version v1
Book
Physical and chemical characterization methods of surfaces and interfaces
Creators
- 1. Centre d'Etudes de Chimie Metallurgique, 94 - Vitry-sur-Seine (France)
Description
The main physical and chemical characterization techniques of surfaces and interfaces are presented. There are: Auger electron spectroscopy, photoelectron spectroscopies (XPS and UPS), secondary ions mass spectroscopy (SIMS), infrared and Raman spectroscopies, electron energy loss spectroscopy (EELS and HREELS) and atomic force microscopy (AFM). For each method is given the theoretical principle, the apparatus and the main uses of the techniques. (O.M.)
Additional details
Additional titles
- Original title (French)
- Methodes de caracterisation physico-chimique des surfaces et des interfaces
Publishing Information
- Publisher
- Section Francaise de l'Adhesion division de la Societe Francaise du Vide
- Imprint Place
- Paris (France)
- Imprint Title
- Study on the adhesion
- Imprint Pagination
- 341 p.
- Journal Page Range
- p. 18-71
Conference
- Title
- JADH'97. 9. seminar on the adhesion
- Original Conference Title
- JADH'97. 9. journees d'etude sur l'adhesion
- Dates
- 29-30 Sep 1997
- Place
- Saint-Lary, Haute Pyrenees (France)
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 29042070
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ADHESION; AUGER ELECTRON SPECTROSCOPY; CHEMICAL ANALYSIS; ELECTRON BEAMS; ENERGY LEVELS; ENERGY-LOSS SPECTROSCOPY; EROSION; EXCITATION; INFRARED SPECTRA; INTERACTIONS; INTERFACES; ION BEAMS; PHOTON BEAMS; RAMAN SPECTROSCOPY; SURFACES
- Descriptors DEC
- BEAMS; ELECTRON SPECTROSCOPY; ENERGY-LEVEL TRANSITIONS; LASER SPECTROSCOPY; LEPTON BEAMS; PARTICLE BEAMS; SPECTRA; SPECTROSCOPY
Optional Information
- Notes
- 27 refs. Imprint:Etude sur l'Adhesion