Published March 22, 2005
| Version v1
Journal article
Characterization of a capacitively coupled RF plasma for SiO2 deposition: numerical and experimental results
Creators
- 1. LPMIA, UMR CNRS 7040, Universite H. Poincare, BP239, 54506 Vandoeuvre les Nancy (France)
- 2. LSGS, UMR CNRS 7570, INPL, Ecole des Mines, Parc de Saurupt, 54042 Nancy Cedex (France)
Description
A fluid model including an electron beam of hot electrons is presented and used to describe the transport of charged particles in a 13.56-MHz O2 plasma. An increase in the electron density when the RF power increases is observed from Langmuir probe measurements. The calculated evolution of the electron number density shows a reasonable agreement if the secondary emission coefficient is chosen equal to 10-4 on a steel (316L) electrode. The values of the plasma potential increase with increasing RF power from 30 to 35 V at 0.5-0.6 Torr, in the range 100-300 W. Surprisingly, the electron temperature decreases with increasing applied RF power. No clear explanation for this behavior is available yet
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2004.07.027;
- PII
- S0040-6090(04)00955-1;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 475
- Journal Issue
- 1-2
- Journal Page Range
- p. 118-123
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- 4. Asian-European international conference on plasma surface engineering
- Dates
- 28 Sep - 3 Oct 2003
- Place
- Jeju City (Korea, Republic of)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36112539
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DEPOSITION; ELECTRON BEAMS; LANGMUIR PROBE; MHZ RANGE 01-100; OXYGEN; PLASMA; PLASMA POTENTIAL; RADIOWAVE RADIATION; SECONDARY EMISSION; SILICON OXIDES; STEELS
- Descriptors DEC
- ALLOYS; BEAMS; CARBON ADDITIONS; CHALCOGENIDES; ELECTRIC POTENTIAL; ELECTRIC PROBES; ELECTROMAGNETIC RADIATION; ELEMENTS; EMISSION; FREQUENCY RANGE; IRON ALLOYS; IRON BASE ALLOYS; LEPTON BEAMS; MHZ RANGE; NONMETALS; OXIDES; OXYGEN COMPOUNDS; PARTICLE BEAMS; PROBES; RADIATIONS; SILICON COMPOUNDS; TRANSITION ELEMENT ALLOYS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.