Published July 2006
| Version v1
Journal article
Studies of DNA damage induced by synchrotron radiation soft X-rays using single cell gel electrophoresis
Creators
- 1. China Science and Technology Univ., Hefei (China). School of Life Science
Description
The DNA damage of wheat root tip cells induced by different doses (0-288 J·cm-2) of synchrotron radiation (SR) soft X-rays was measured by using the single-cell gel electrophoresis (SCGE) technique. The DNA removal in electrophoresis was observed and the results showed that 20%-92% of wheat root tip cells were damaged with the increase of radiation dose, and the DNA damage level (expressed by Tail Moment) was positively correlated with the dose of synchrotron radiation soft X-rays. (authors)
Additional details
Publishing Information
- Journal Title
- Nuclear Techniques
- Journal Volume
- 29
- Journal Issue
- 7
- Journal Page Range
- p. 481-484
- ISSN
- 0253-3219
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 37107884
- Subject category
- S63: RADIATION, THERMAL, AND OTHER ENVIRONMENTAL POLLUTANT EFFECTS ON LIVING ORGANISMS AND BIOLOGICAL MATERIALS;
- Descriptors DEI
- DNA; DNA DAMAGES; ELECTROPHORESIS; GELS; PLANT CELLS; RADIATION DOSES; REMOVAL; ROOTS; SOFT X RADIATION; SYNCHROTRON RADIATION; WHEAT
- Descriptors DEC
- BREMSSTRAHLUNG; CEREALS; COLLOIDS; DISPERSIONS; DOSES; ELECTROMAGNETIC RADIATION; GRAMINEAE; IONIZING RADIATIONS; LILIOPSIDA; MAGNOLIOPHYTA; NUCLEIC ACIDS; ORGANIC COMPOUNDS; PLANTS; RADIATIONS; X RADIATION
Optional Information
- Notes
- 3 figs., 1 tab., 10 refs.