A theoretical model on surface electronic behavior: Strain effect
Creators
- 1. College of Science, Northeast Dianli University, Jilin 132012 (China)
- 2. Department of Mechanical and Manufacturing Engineering, University of Calgary, Calgary, Alberta, T2N 1N4 (Canada)
Description
Deformation from mechanical loading can affect surface electronic behavior. Surface deformation and electronic behavior can be quantitatively expressed using strain and work function, respectively, and their experimental relationship can be readily determined using the Kelvin probing technique. However, the theoretical correlation between work function and strain has been unclear. This study reports our theoretical exploration, for the first time, of the effect of strain on work function. We propose a simple electrostatic action model by considering the effect of a dislocation on work function of a one-dimensional lattice and further extend this model to the complex conditions for the effect of dislocation density. Based on this model, we established successfully a theoretical correlation between work function and strain.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physb.2009.04.022Additional details
Identifiers
- DOI
- 10.1016/j.physb.2009.04.022;
- PII
- S0921-4526(09)00233-6;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 404
- Journal Issue
- 16
- Journal Page Range
- p. 2247-2250
- ISSN
- 0921-4526
- CODEN
- PHYBE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41085162
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CORRELATIONS; DEFORMATION; DENSITY; DISLOCATIONS; ELECTRONS; SIMULATION; STRAINS; SURFACE PROPERTIES; SURFACES; WORK FUNCTIONS
- Descriptors DEC
- CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELEMENTARY PARTICLES; FERMIONS; FUNCTIONS; LEPTONS; LINE DEFECTS; PHYSICAL PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.