Properties of Sb-doped SnO2 transparent conductive thin films deposited by radio-frequency magnetron sputtering
Creators
Description
Transparent conducting Sb-doped SnO2 (ATO) thin films were prepared on quartz substrates by radio-frequency magnetron sputtering technique. The X-ray diffraction measurement shows that the as-deposited ATO film is of tetragonal crystal structure. Electrical and optical properties were investigated by Hall and optical measurements. The resistivity and optical transmittance of the ATO thin films are of the order of 10−3 Ω · cm and over 85%, respectively. The lowest electrical resistivity of the films was found to be about 1.99 × 10−3 Ω · cm. Finally, the organic solar cell with the ATO thin film as an anode was prepared, and a power conversion efficiency of 1.11% was achieved. - Highlights: • The Sb-doped SnO2 (ATO) thin films are prepared on quartz substrates by magnetron sputtering. • The ATO thin films have low resistivity and high optical transparency. • The power conversion efficiency of organic solar cells with ATO thin films is 1.11%
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2013.06.077Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2013.06.077;
- PII
- S0040-6090(13)01129-2;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 542
- Journal Page Range
- p. 285-288
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46090228
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANTIMONY; CRYSTAL STRUCTURE; DEPOSITS; DOPED MATERIALS; EFFICIENCY; ELECTRIC CONDUCTIVITY; MAGNETRONS; SPUTTERING; SUBSTRATES; THIN FILMS; TIN OXIDES; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FILMS; MATERIALS; METALS; MICROWAVE EQUIPMENT; MICROWAVE TUBES; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SCATTERING; TIN COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.