Published March 1, 2012
| Version v1
Journal article
Swelling effects in Y2Ti2O7 pyrochlore irradiated with 400 keV Ne2+ ions
- 1. School of Nuclear Science and Technology, Lanzhou University, Lanzhou 730000 (China)
- 2. Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM 87545 (United States)
Description
Polycrystalline pyrochlore Y2Ti2O7 compounds were irradiated with 400 keV Ne2+ ions at cryogenic temperature (∼77 K) at fluences ranging from 5 × 1014 to 1 × 1016 ions/cm2, corresponding to a peak ballistic damage dose of ∼0.17–3.4 displacements per atom (dpa). Irradiation-induced structural evolution was examined using grazing incidence X-ray diffraction at X-ray incident angles from 0.25° to 3° and cross-sectional transmission electron microscopy. An apparent swelling effect was observed on the irradiation layer prior to the irradiated layer being amorphized. The swelling effect increased with increasing ion irradiation fluence. At an ion induced damage of 1.7 dpa, the irradiated layer started to be amorphized.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2011.11.012Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2011.11.012;
- PII
- S0168-583X(11)01008-1;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 274
- Journal Page Range
- p. 182-187
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44034205
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ATOMIC DISPLACEMENTS; DAMAGE; DOSES; INCIDENCE ANGLE; IRRADIATION; KEV RANGE; NEON IONS; POLYCRYSTALS; PYROCHLORE; SWELLING; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- CHARGED PARTICLES; COHERENT SCATTERING; CRYSTALS; DEFORMATION; DIFFRACTION; ELECTRON MICROSCOPY; ENERGY RANGE; IONS; MICROSCOPY; MINERALS; PHYSICAL RADIATION EFFECTS; RADIATION EFFECTS; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.