Characterization of Doped Silicon Thermometers for Very High Sensitivity Cryogenic Bolometers
Creators
- 1. Université Paris-Saclay, IRFU, CEA (France)
- 2. MINATEC, CEA/LETI (France)
Description
Understanding the origin and early evolution of stars is one of the fundamental objectives of astronomy. This can be possible with observations made from space in the mid- to far-infrared and millimeter-wave part of the spectrum which require detectors with very high sensitivity. In the framework of the SPICA project and the course of developing cooled semiconductor bolometers for sub-millimeter-wave detection, typically 100 μm ≤ λ ≤ 1.5 mm, we have investigated several thermometers based on doped silicon Si:P,B. We observed an important dependence of the Si:P,B resistance to the doping densities and found potential thermometers for cryogenic detections at very low temperatures (50 mK < T < 100 mK). In addition, numerical simulations allowed us to study the thermoelectrical behavior of the potential detectors and predict a clear enhancement of the detector performances.
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Low Temperature Physics
- Journal Volume
- 193
- Journal Issue
- 3-4
- Journal Page Range
- p. 415-421
- ISSN
- 0022-2291
- CODEN
- JLTPAC
Conference
- Title
- International workshop on low temperature detectors
- Acronym
- LTD17
- Dates
- 17-21 Jul 2017
- Place
- Kurume City, Fukuoka (Japan)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 50054301
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ASTRONOMY; BOLOMETERS; COMPUTERIZED SIMULATION; DENSITY; DETECTION; DOPED MATERIALS; ORIGIN; PERFORMANCE; SEMICONDUCTOR MATERIALS; SENSITIVITY; SILICON; SPACE; SPECTRA; STARS; TEMPERATURE RANGE 0000-0013 K; THERMOMETERS
- Descriptors DEC
- ELEMENTS; MATERIALS; MEASURING INSTRUMENTS; PHYSICAL PROPERTIES; SEMIMETALS; SIMULATION; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2018 Springer Science+Business Media, LLC, part of Springer Nature
- Notes
- http://www.springer-ny.com