Published May 1970
| Version v1
Journal article
The connection between amorphization and forming of point defects following ion bombardment of germanium and silicon
- 1. Gor'kovskij Gosudarstvennyj Univ. (USSR). Issledovatel'skij Fiziko-Tekhnicheskij Inst.
Description
no abstract available
Additional details
Additional titles
- Original title (Russian)
- Связь между аморфизацией и образованием точечных дефектов при ионной бомбардировке германия и кремния
Publishing Information
- Journal Title
- Dokl. Akad. Nauk SSSR
- Journal Volume
- 192
- Journal Issue
- 2
- Series
- Dokl. Akad. Nauk SSSR.
- Journal Page Range
- 324-326
INIS
- Country of Publication
- USSR
- Country of Input or Organization
- USSR
- INIS RN
- 2006600
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Progress Report
- Descriptors DEI
- GERMANIUM; SILICON; POINT DEFECTS; IONS; BOMBARDMENT; AMORPHOUS STATE; RADIATION EFFECTS