Facile preparation of superhydrophobic copper surface by HNO3 etching technique with the assistance of CTAB and ultrasonication
Creators
- 1. Faculty of Science, Beijing University of Chemical Technology, 79, Beijing 100029 (China)
Description
Superhydrophobic rough structure was prepared on copper wafer via HNO3 etching technique with the assistance of Cetyltrimethyl Ammonium Bromide (CTAB) and ultrasonication. After modification of 1H,1H,2H,2H-perfluorodecyltriethoxysilane (FDTES), the copper wafer showed stable superhydrophobicity. The morphologies, chemical compositions and hydrophobicity of the substrates were analyzed by scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS) and water contact angle measurement. Dense and spherical micropits appeared on copper wafer after it was etched by 5 M nitric acid with 1.2 mM CTAB under ultrasonication for 20 min. The SEM results indicated that the joint action of CTAB and ultrasonication caused the formation of dense and spherical micropits.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2010.09.001Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2010.09.001;
- PII
- S0169-4332(10)01219-5;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 257
- Journal Issue
- 5
- Journal Page Range
- p. 1707-1711
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44024344
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- AMMONIUM COMPOUNDS; COPPER; ETCHING; NITRIC ACID; SCANNING ELECTRON MICROSCOPY; SPHERICAL CONFIGURATION; SUBSTRATES; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CONFIGURATION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTS; HYDROGEN COMPOUNDS; INORGANIC ACIDS; INORGANIC COMPOUNDS; METALS; MICROSCOPY; NITROGEN COMPOUNDS; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; SPECTROSCOPY; SURFACE FINISHING; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.