Development of a bright polychromator for thomson scattering measurements
Creators
- 1. Tokyo University, Graduate School of Frontier Sciences, Kashiwa, Chiba (Japan)
- 2. Kyushu University, Research Institute for Applied Mechanics, Kasuga, Fukuoka (Japan)
- 3. National Institute for Fusion Science, Toki, Gifu (Japan)
Description
A bright polychromator for compact, efficient YAG Thomson scattering measurement was designed on the basis of ray-tracing calculations. The optical input of the polychromator is a 2-mm-diameter optical fiber with a numerical aperture of 0.37. High refractive index glass lenses with monolayer anti-reflection coatings were used to reduce aberration effects and achieve good efficiency. A fast, low-noise detection system consisting of an avalanche photodiode and operational amplifiers was designed and tested using YAG laser pulses; the measured full width at half maximum (FWHM) of the laser pulse was 10 ns. The measured noise was dominated by the thermal noise of the input resistance R (= 470 Ω) when the signal was low, and the shot noise became dominant when the number of detected photons was greater than about 500. (author)
Additional details
Publishing Information
- Journal Title
- Plasma and Fusion Research
- Journal Volume
- 5
- Journal Issue
- special issue 2
- Journal Page Range
- p. S2082.1-S2082.4
- ISSN
- 1880-6821
Conference
- Title
- 19. international Toki conference on advanced physics in plasma and fusion research
- Acronym
- ITC-19
- Dates
- 8-11 Dec 2009
- Place
- Toki, Gifu (Japan)
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 45098188
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- LASER RADIATION; LOW-BETA PLASMA; OPTICAL FIBERS; PHOTODIODES; PLASMA DIAGNOSTICS; SPECTROMETERS; SPHERICAL CONFIGURATION; START-UP; THOMSON SCATTERING; TOKAMAK DEVICES
- Descriptors DEC
- CLOSED PLASMA DEVICES; CONFIGURATION; ELECTROMAGNETIC RADIATION; FIBERS; INELASTIC SCATTERING; MEASURING INSTRUMENTS; PLASMA; RADIATIONS; SCATTERING; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; THERMONUCLEAR DEVICES
Optional Information
- Notes
- 9 refs., 6 figs.