Note: Continuing improvements on the novel flat-response x-ray detector

This note describes multi-updates of the novel flat-response x-ray detector in fabrication technology, experimental application, and data uncertainty evaluation. Unlike the previous design, the compound filter is combined into one piece through an improved fabrication process that greatly enhanced its self-supporting capability. A method of pinhole-array imaging is introduced into the experimental application process to stop any debris from the hohlraum and to uniformly reduce the radiation flux. The experimental results show that this method works well. Furthermore, a method of uncertainty evaluation of the radiation flux measurement by the novel flat-response x-ray detector has been developed. The influence of the radiation spectrum to the flux measurement is analyzed. The evaluation shows that the relative uncertainty of the radiation flux is about 10% in higher radiation temperature condition (Tr > 150 eV) and 16% in lower radiation temperature condition (Tr < 100 eV).