Characterization and performance analysis of a new stoneware
Creators
- 1. You Ji Ceramic Art Research Institute, Chaozhou (China)
- 2. Shanghai Aerospace Bowen Co., Ltd., Shanghai (China)
Description
Guangdong Baojue New material Industry Co., Ltd fired stoneware with local rock and ore as main raw material. The material and properties of stoneware were characterized in this paper. The composition of stoneware was analyzed by inductively coupled plasma emission spectroscopy (ICP-AES) and X-ray fluorescence spectroscopy (XRF). The phase composition and microstructure of stoneware were analyzed by XRD and metallographic microscope. In this paper, the full-emittance, the air negative ion concentration, the content of the toxic component and the chlorine-removing ability were tested, and the soaking test of the Chinese liquor was carried out. The results showed that stoneware was an excellent material for drinking utensils and was beneficial to human health. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1757-899X/490/2/022080Additional details
Identifiers
Publishing Information
- Journal Title
- IOP Conference Series. Materials Science and Engineering (Online)
- Journal Volume
- 490
- Journal Issue
- 2
- Journal Page Range
- [5 p.]
- ISSN
- 1757-899X
Conference
- Title
- 2. International Symposium on Application of Materials Science and Energy Materials
- Acronym
- SAMSE 2018
- Dates
- 17-18 Dec 2018
- Place
- Shanghai (China)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52113146
- Subject category
- S36: MATERIALS SCIENCE; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANIONS; AUGER ELECTRON SPECTROSCOPY; CHLORINE; CONCENTRATION RATIO; EMISSION SPECTROSCOPY; METALLOGRAPHY; MICROSCOPES; MICROSTRUCTURE; ORES; PERFORMANCE; PLASMA; RAW MATERIALS; ROCKS; TOXICITY; X-RAY DIFFRACTION; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- CHARGED PARTICLES; CHEMICAL ANALYSIS; COHERENT SCATTERING; DIFFRACTION; DIMENSIONLESS NUMBERS; ELECTRON SPECTROSCOPY; ELEMENTS; HALOGENS; IONS; MATERIALS; NONDESTRUCTIVE ANALYSIS; NONMETALS; SCATTERING; SPECTROSCOPY; X-RAY EMISSION ANALYSIS