Uniaxial magnetic anisotropy in three-bilayer Co/Cu and Co/Al superlattices
Creators
- 1. Department of Physics, Applied Physics and Astronomy, Rensselaer Polytechnic Institute, 110, 8th Street, Troy, NY 12180-3590 (United States)
- 2. Department of Physics, University at Albany, State University of New York, 1400 Washington Avenue, Albany, NY 12222 (United States)
Description
Highlights: • Three-bilayer ultrathin Co/Cu and Co/Al superlattices show low coercivity. • Uniaxial magnetic anisotropy was observed in Co/Cu and Co/Al superlattices. • Co/Cu superlattice shows anisotropic magnetoresistance. • Interface roughness and layer thickness of superlattices affect magnetic properties. -- Abstract: We present the magnetic properties of three-bilayer superlattices [Co(0.8 nm)/Cu(1.1 nm)]3 and Co(0.8 nm)/Al(2.2 nm)]3 grown by magnetron sputter deposition on SiO2 substrates. Using the surface magneto-optical Kerr effect we observed longitudinal magnetic hysteresis loops with low coercivity values of < 17 × 10−4 T and < 7 × 10−4 T from Co/Cu and Co/Al superlattices, respectively. From the hysteresis loops as a function of in-plane azimuthal angle of the Co/Cu and Co/Al superlattices, we observed an in-plane uniaxial anisotropy in coercivity and squareness. Using a four-point square configuration we observed positive and negative anisotropic magnetoresistances (AMR) with values +0.5% and −0.5% from Co/Cu superlattice depending on whether the applied current is perpendicular or parallel to the applied magnetic field direction, respectively. The surface morphology including vertical root-mean-square roughness and lateral correlation length were examined by atomic force microscopy. The number of bilayers and the thicknesses of Co, Cu and Al in the superlattices were examined by X-ray reflectivity. The observed magnetic properties were correlated to the interface roughness and layer thickness. The low coercivity, low saturation field, near-one squareness, and finite MR value of the three-bilayer Co/Cu superlattice has potential applications in low magnetic field detection and sensors.
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2019.04.048;
- PII
- S0040609019302585;
Publishing Information
- Journal Title
- Thin Solid Films (Print)
- Journal Volume
- 681
- Journal Page Range
- p. 32-40
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 55041026
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANISOTROPY; ATOMIC FORCE MICROSCOPY; COERCIVE FORCE; KERR EFFECT; MAGNETIC FIELDS; MAGNETIC PROPERTIES; MAGNETORESISTANCE; MAGNETRONS; MORPHOLOGY; REFLECTIVITY; ROUGHNESS; SENSORS; SILICON OXIDES; SQUARE CONFIGURATION; SUBSTRATES; SUPERLATTICES; X RADIATION
- Descriptors DEC
- CHALCOGENIDES; CONFIGURATION; DIELECTRIC PROPERTIES; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; ELECTRON TUBES; ELECTRONIC EQUIPMENT; EQUIPMENT; IONIZING RADIATIONS; MICROSCOPY; MICROWAVE EQUIPMENT; MICROWAVE TUBES; OPTICAL PROPERTIES; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATIONS; RECTANGULAR CONFIGURATION; SILICON COMPOUNDS; SURFACE PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2019 Elsevier B.V. All rights reserved.