Wedged multilayer Laue lens
Creators
- 1. X-ray Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
- 2. Center for Nanoscale Materials, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
- 3. Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
Description
A multilayer Laue lens (MLL) is an x-ray focusing optic fabricated from a multilayer structure consisting of thousands of layers of two different materials produced by thin-film deposition. The sequence of layer thicknesses is controlled to satisfy the Fresnel zone plate law and the multilayer is sectioned to form the optic. An improved MLL geometry can be created by growing each layer with an in-plane thickness gradient to form a wedge, so that every interface makes the correct angle with the incident beam for symmetric Bragg diffraction. The ultimate hard x-ray focusing performance of a wedged MLL has been predicted to be significantly better than that of a nonwedged MLL, giving subnanometer resolution with high efficiency. Here, we describe a method to deposit the multilayer structure needed for an ideal wedged MLL and report our initial deposition results to produce these structures
Additional details
Identifiers
- DOI
- 10.1063/1.2924209;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 79
- Journal Issue
- 5
- Journal Page Range
- p. 053104-053104.4
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40006622
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- BRAGG REFLECTION; DEPOSITION; EFFICIENCY; FOCUSING; GEOMETRY; HARD X RADIATION; INTERFACES; LAYERS; LENSES; OPTICS; PERFORMANCE; PLATES; RESOLUTION; SPUTTERING; THICKNESS; THIN FILMS
- Descriptors DEC
- DIMENSIONS; ELECTROMAGNETIC RADIATION; FILMS; IONIZING RADIATIONS; MATHEMATICS; RADIATIONS; REFLECTION; X RADIATION
Optional Information
- Notes
- (c) 2008 American Institute of Physics