M spectra of the rare earth elements measured with an ultra-thin window Si(Li) detector
Creators
- 1. Institut fuer Physikalische Hochtechnologie, Winzerlaer Strasse 10, Jena (Germany)
Description
The oxides of the rare earth elements 57≤Z≤71 were excited by electrons with an energy between 3 and 15 keV. X-rays were detected by an energy dispersive Si(Li) spectrometer, with an ultra-thin polymer entrance window. Due to the limited resolution of this type of spectrometer, the M spectra of the rare earths appear to consist of only four peaks: Mζ, Mαβ, Mγ, and M2N4. The net height of these peaks relative to that of Mαβ was used as a measure of the relative intensity. For 3 keV electrons, a continuous decrease of the relative intensity of Mζ with increasing Z was observed, ranging from approximately 90 % for 57 La to less than 10 % for 71 Lu. This behavior is in agreement with a model involving a gradual filling up of the levels N6 and N7 with increasing Z. The relative intensity of Mγ is lower than that of Mζ by about a factor of 5, whereas M2N4 is approximately half as intense as Mγ. (author)
Additional details
Publishing Information
- Journal Title
- Mikrochimica Acta
- Journal Volume
- 145
- Journal Issue
- 1-4
- Journal Page Range
- p. 261-265
- ISSN
- 0026-3672
- CODEN
- MIACAQ
INIS
- Country of Publication
- Austria
- Country of Input or Organization
- Austria
- INIS RN
- 35089252
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- ELECTRON BEAMS; ELECTRON MICROPROBE ANALYSIS; EXCITATION; KEV RANGE 01-10; KEV RANGE 10-100; LANTHANUM; LUTETIUM; RARE EARTH COMPOUNDS; RARE EARTHS; X-RAY SPECTRA
- Descriptors DEC
- BEAMS; CHEMICAL ANALYSIS; ELEMENTS; ENERGY RANGE; ENERGY-LEVEL TRANSITIONS; KEV RANGE; LEPTON BEAMS; METALS; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; PARTICLE BEAMS; RARE EARTHS; SPECTRA