Structural characterization and luminescence properties of Dy3+ doped Ca3MgSi2O8 phosphors
- 1. SoS in Physics and Astrophysics, Pt. Ravishankar Shukla University, Raipur, Chhattisgarh, Pin-492010 (India)
Description
Different concentrations of Dy3+ doped Ca3MgSi2O8 phosphors were synthesis by solid state reaction method. X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), thermoluminescence (TL) and photoluminescence (PL) were carried out. The absorption band located at 351 nm is a main excitation peak matching with the emission of near white light emitting diodes ultraviolet light (400–700 nm). The emission spectra consist mainly group of three emission bands, which are situated around 482 nm, 493 nm (both correspond to blue emission) and 574 nm (correspond to yellow emission). These bands can be assigned to the transitions 4F9/2 → 6H15/2 and 4F9/2 → 6H13/2, respectively. The concentration quenching effect for Dy3+ was found at the optimum doping concentration of 2.0 mol %. The thermoluminescence results show that the corresponding increase or decrease in afterglow is associated with trap density, but no change in trap depth. The underlying reason of photoluminescence and afterglow property is discussed. The prepared phosphor may be useful for eco-friendly lighting technology.
Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2018.10.390;
- PII
- S0925838818340933;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 777
- Journal Page Range
- p. 423-433
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 55051473
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION; AFTERGLOW; DOPED MATERIALS; DYSPROSIUM IONS; EMISSION SPECTRA; LIGHT EMITTING DIODES; PHOSPHORS; PHOTOLUMINESCENCE; SCANNING ELECTRON MICROSCOPY; THERMOLUMINESCENCE; TRANSMISSION ELECTRON MICROSCOPY; ULTRAVIOLET RADIATION; X-RAY DIFFRACTION
- Descriptors DEC
- CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; EMISSION; IONS; LUMINESCENCE; MATERIALS; MICROSCOPY; PHOTON EMISSION; RADIATIONS; SCATTERING; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SORPTION; SPECTRA
Optional Information
- Copyright
- Copyright (c) 2018 Elsevier B.V. All rights reserved.