Published 2013 | Version v1
Book Metadata-only

Leakage currents among CMOS IC elements after low-intensive gamma-irradiation

Creators

  • 1. Natsional'nyj Issledovatel'skij Yadernyj Univ. MIFI, Moscow (Russian Federation)

Description

no abstract available

Part of:
Scientific session of NRNU MEPHI-2013. Abstracts. In three volumes. Volume 1. Innovative nuclear technologies. High technologies in medicine

Additional details

Additional titles

Original title (Russian)
Токи утечки между элементами KMOP IMS после низкоинтенсивного облучения гамма-лучами

Publishing Information

Publisher
NIYaU MIFI
Imprint Place
Moscow (Russian Federation)
ISBN
978-5-7262-1786-4
Imprint Title
Scientific session of NRNU MEPHI-2013. Abstracts. In three volumes. Volume 1. Innovative nuclear technologies. High technologies in medicine
Imprint Pagination
300 p.
Journal Page Range
p. 143

Conference

Title
Scientific session of NRNU MEPHI-2013
Original Conference Title
Nauchnaya sessiya NIYaU MIFI-2013
Dates
2013
Place
Moscow (Russian Federation)

INIS

Country of Publication
Russian Federation
Country of Input or Organization
Russian Federation
INIS RN
45109469
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
No Abstract, Conference
Descriptors DEI
CORRELATIONS; GAMMA RADIATION; LEAKAGE CURRENT; LOW DOSE IRRADIATION; MIS TRANSISTORS; RADIATION DOSES
Descriptors DEC
CURRENTS; DOSES; ELECTRIC CURRENTS; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; IRRADIATION; RADIATIONS; SEMICONDUCTOR DEVICES; TRANSISTORS

Optional Information

Notes
Imprint:Nauchnaya sessiya NIYaU MIFI-2013. Annotatsii dokladov. V 3-kh tomakh. Tom 1. Innovatsionnye yadernye tekhnologii. Vysokie tekhnologii v meditsine