Published November 2022
| Version v1
Journal article
Electron irradiation effects on single-layer MoS obtained by gold-assisted exfoliation
Creators
- 1. Department of Physics and Astronomy, University of Catania, Catania, 95123 (Italy)
- 2. National Council of Research, Institute for Microelectronic and Microsystems (CNR-IMM), Catania, 95121 (Italy)
- 3. LSI, CEA/DRF/IRAMIS, CNRS, Ecole Polytechnique, Institut Polytechnique de Paris, Palaiseau, 91120 (France)
- 4. ATeN Center, University of Palermo, Palermo, 90128 (Italy)
- 5. Department of Physics and Chemistry Emilio Segrè, University of Palermo, Palermo, 90123 (Italy)
Description
Mechanical exfoliation assisted by gold is applied to obtain good quality large lateral size single-layer MoS. The effects of 2.5 MeV electron irradiation are investigated at room temperature on structural and electronic features by Raman and microluminescence spectroscopy. The exciton recombination emission in the direct bandgap of single-layer MoS is affected during irradiation starting from the minimum explored dose of 1 kGy. At higher doses, Raman bands show no relevant modifications whereas the exciton emission is quenched, suggesting that irradiation-induced point defects affect exciton dynamics. (© 2022 Wiley‐VCH GmbH)
Availability note (English)
Available from: http://dx.doi.org/10.1002/pssa.202200096Additional details
Identifiers
Publishing Information
- Journal Title
- Physica Status Solidi. A, Applications and Materials Science (Online)
- Journal Volume
- 219
- Journal Issue
- 21
- Journal Page Range
- p. 1-6
- ISSN
- 1862-6319
- CODEN
- PSSABA
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 54010473
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; ELECTRON BEAMS; ELECTRONIC STRUCTURE; EMISSION SPECTROSCOPY; EXCITONS; GOLD; IRRADIATION; KILO GY RANGE; MEV RANGE 01-10; MOLYBDENUM SULFIDES; PHOTOLUMINESCENCE; POINT DEFECTS; RADIATION DOSES; RAMAN SPECTRA; RECOMBINATION; TEMPERATURE RANGE 0273-0400 K
- Descriptors DEC
- ABSORBED DOSE RANGE; BEAMS; CHALCOGENIDES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DOSES; ELEMENTS; EMISSION; ENERGY RANGE; LEPTON BEAMS; LUMINESCENCE; METALS; MEV RANGE; MICROSCOPY; MOLYBDENUM COMPOUNDS; PARTICLE BEAMS; PHOTON EMISSION; QUASI PARTICLES; RADIATION DOSE RANGES; REFRACTORY METAL COMPOUNDS; SPECTRA; SPECTROSCOPY; SULFIDES; SULFUR COMPOUNDS; TEMPERATURE RANGE; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Notes
- AID: 2200096