Published January 2011 | Version v1
Journal article

Single-shot carrier-envelope-phase-tagged ion-momentum imaging of nonsequential double ionization of argon in intense 4-fs laser fields

  • 1. Institut fuer Optik und Quantenelektronik, Friedrich-Schiller-Universitaet, D-07743 Jena, Germany and Helmholtz Institut Jena, D-07743 Jena (Germany)
  • 2. University of Virginia, Charlottesville, Virginia 22904 (United States)
  • 3. Max-Planck-Institut fuer Kernphysik, D-69117 Heidelberg (Germany)
  • 4. Max-Planck-Institut fuer Quantenoptik, D-85748 Garching (Germany) and J. R. Macdonald Laboratory, Department of Physics, Kansas State University, Manhattan, Kansas 66506 (United States)

Description

Single-shot carrier-envelope-phase (CEP) tagging is combined with a reaction mircoscope (REMI) to investigate CEP-dependent processes in atoms. Excellent experimental stability and data acquisition longevity are achieved. Using this approach, we study the CEP effects for nonsequential double ionization of argon in 4-fs laser fields at 750 nm and an intensity of 1.6x1014 W/cm2. The Ar2+ ionization yield shows a pronounced CEP dependence which compares well with recent theoretical predictions employing quantitative rescattering theory [S. Micheau et al., Phys. Rev. A 79, 013417 (2009)]. Furthermore, we find strong CEP influences on the Ar2+ momentum spectra along the laser polarization axis.

Additional details

Identifiers

Publishing Information

Journal Title
Physical Review. A
Journal Volume
83
Journal Issue
1
Journal Page Range
p. 013412-013412.5
ISSN
1050-2947
CODEN
PLRAAN

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43008939
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Numerical Data
Descriptors DEI
ARGON; ATOMS; CARRIERS; COMPARATIVE EVALUATIONS; DATA ACQUISITION; IONIZATION; IONS; LASER RADIATION; POLARIZATION; RESCATTERING; SPECTRA; STABILITY; THEORETICAL DATA
Descriptors DEC
CHARGED PARTICLES; DATA; ELECTROMAGNETIC RADIATION; ELEMENTS; EVALUATION; FLUIDS; GASES; INFORMATION; NONMETALS; NUMERICAL DATA; RADIATIONS; RARE GASES; SCATTERING

Optional Information

Notes
(c) 2011 American Institute of Physics