Published March 21, 2002 | Version v1
Journal article

A high resolution silicon beam telescope

Description

We describe the design and present the performances of a charged particle telescope used for high resolution silicon pixel developments. A telescope made of four x and four y single-sided silicon microstrip layers was built, providing an r.m.s. position resolution of 1 μm for high energy charged particles. A signal over noise ratio of 130 was achieved with minimum ionizing particles

Additional details

Identifiers

PII
S0168900201012414;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
480
Journal Issue
2-3
Journal Page Range
p. 501-507
ISSN
0168-9002
CODEN
NIMAER

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
34003385
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
CHARGED PARTICLE DETECTION; SI SEMICONDUCTOR DETECTORS; SIGNAL-TO-NOISE RATIO; SPATIAL RESOLUTION; TELESCOPES
Descriptors DEC
DETECTION; MEASURING INSTRUMENTS; RADIATION DETECTION; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS

Optional Information

Copyright
Copyright (c) 2002 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.