Published March 21, 2002
| Version v1
Journal article
A high resolution silicon beam telescope
Description
We describe the design and present the performances of a charged particle telescope used for high resolution silicon pixel developments. A telescope made of four x and four y single-sided silicon microstrip layers was built, providing an r.m.s. position resolution of 1 μm for high energy charged particles. A signal over noise ratio of 130 was achieved with minimum ionizing particles
Additional details
Identifiers
- PII
- S0168900201012414;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 480
- Journal Issue
- 2-3
- Journal Page Range
- p. 501-507
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 34003385
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CHARGED PARTICLE DETECTION; SI SEMICONDUCTOR DETECTORS; SIGNAL-TO-NOISE RATIO; SPATIAL RESOLUTION; TELESCOPES
- Descriptors DEC
- DETECTION; MEASURING INSTRUMENTS; RADIATION DETECTION; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS
Optional Information
- Copyright
- Copyright (c) 2002 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.