Published March 30, 1999
| Version v1
Patent
Measuring short electron bunch lengths using coherent Smith-Purcell radiation
Description
A method is provided for directly determining the length of sub-picosecond electron bunches. A metallic grating is formed with a groove spacing greater than a length expected for the electron bunches. The electron bunches are passed over the metallic grating to generate coherent and incoherent Smith-Purcell radiation. The angular distribution of the coherent Smith-Purcell radiation is then mapped to directly deduce the length of the electron bunches. 8 figs
Availability note (English)
Available from Patent and Trademark Office, Box 9, Washington, DC 20232 (United States)Additional details
Publishing Information
- Imprint Pagination
- [10 p.]
- IPC:
- Int. Cl. H01S 3/00
- IPC
- Int. Cl. H01S 3/00
- Patent number
- US patent document 5,889,797/A/
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 30036052
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Non-conventional Literature
- Descriptors DEI
- BEAM MONITORING; COHERENT RADIATION; ELECTRON BEAMS; GRIDS; MEASURING METHODS
- Descriptors DEC
- BEAMS; ELECTRODES; ELECTROMAGNETIC RADIATION; LEPTON BEAMS; MONITORING; PARTICLE BEAMS; RADIATIONS
Optional Information
- Funding organization
- USDOE, Washington, DC (United States)
- Secondary number(s)
- US patent application 8-915,240