A high-sensitivity biaxial resonant accelerometer with two-stage microleverage mechanisms
Creators
- 1. The State Key Laboratory of Fluid Power Transmission and Control, Zhejiang University, Hangzhou 310027 (China)
Description
This paper presents a design and experimental evaluation of a micro-electro-mechanical system biaxial resonant accelerometer with two-stage microleverage mechanisms. The device incorporates two pairs of double-ended tuning fork resonators coupled to a single proof mass. The two-stage microleverage mechanisms possess a higher amplification factor than single-stage microleverage mechanisms, so that the proposed accelerometer has a high level of sensitivity. In addition, a low level of cross-axis sensitivity is realized because of the decoupling beams. The accelerometer is theoretically analyzed and then simulated in the system level by the finite element method. The device is fabricated in a silicon-on-insulator wafer. The experimental results demonstrate that the average differential sensitivity of the resonant accelerometer is 275 Hz g−1 at a resonant frequency of 290 kHz under a polarization voltage of 5 V. The measured cross-axis sensitivity is lower than 3.4%. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0960-1317/26/1/015011Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Micromechanics and Microengineering. Structures, Devices and Systems
- Journal Volume
- 26
- Journal Issue
- 1
- Journal Page Range
- [11 p.]
- ISSN
- 0960-1317
- CODEN
- JMMIEZ
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47079475
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ACCELEROMETERS; AMPLIFICATION; BEAMS; DECOUPLING; ELECTRIC POTENTIAL; FINITE ELEMENT METHOD; KHZ RANGE 100-1000; POLARIZATION; RESONATORS; SENSITIVITY; SILICON; SIMULATION; TUNING
- Descriptors DEC
- CALCULATION METHODS; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FREQUENCY RANGE; KHZ RANGE; MATHEMATICAL SOLUTIONS; MEASURING INSTRUMENTS; NUMERICAL SOLUTION; SEMIMETALS