Published 1973
| Version v1
Book
The damage produced around ion tracks in implanted silicon
Creators
- 1. Rome Univ. (Italy). Istituto di Fisica
Description
no abstract available
Additional details
Publishing Information
- Publisher
- Institute of Physics.
- Imprint Place
- London
- ISBN
- 0854981063
- Imprint Title
- Radiation damage and defects in semiconductors
- Imprint Pagination
- p. 159-164.
- Journal Issue
- no. 16
- Series
- Conference series.
Conference
- Title
- International conference on radiation damage and defects in semiconductors.
- Dates
- 19 Jul 1972.
- Place
- Reading, UK.
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 4065269
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CRYSTAL DEFECTS; DISTANCE; INDIUM IONS; ION BEAMS; ION CHANNELING; ION IMPLANTATION; IRRADIATION; KEV RANGE 10-100; PARTICLE TRACKS; RADIATION EFFECTS; SEMICONDUCTOR MATERIALS; SILICON; THERMAL SPIKES
- Descriptors DEC
- BEAMS; CHANNELING; CHARGED PARTICLES; CRYSTAL STRUCTURE; ELEMENTS; ENERGY RANGE; IONS; KEV RANGE; SEMIMETALS