Finite element simulations of low-mass readout cables for the CBM Silicon Tracking System using RAPHAEL
- 1. GSI Helmholtzzentrum für Schwerionenforschung GmbH, Darmstadt (Germany)
- 2. Goethe University, Frankfurt (Germany)
Description
The first three-dimensional simulation study of thin multi-line readout cables using finite element simulation tool RAPHAEL is being reported. The application is the Silicon Tracking System (STS) of the fixed-target heavy-ion experiment Compressed Baryonic Matter (CBM), under design at the forthcoming accelerator center FAIR in Germany. RAPHAEL has been used to design low-mass analog readout cables with minimum possible Equivalent Noise Charge (ENC). Various trace geometries and trace materials have been explored in detail for this optimization study. These cables will bridge the distance between the microstrip detectors and the signal processing electronics placed at the periphery of the silicon tracking stations. SPICE modeling has been implemented in Sentaurus Device to study the transmission loss (dB loss) in cables and simulation has been validated with measurements. An optimized design having minimum possible ENC, material budget and transmission loss for the readout cables has been proposed
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2013.09.029Additional details
Identifiers
- DOI
- 10.1016/j.nima.2013.09.029;
- PII
- S0168-9002(13)01263-1;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 735
- Journal Page Range
- p. 366-373
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45070541
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BARYONS; FINITE ELEMENT METHOD; HEAVY IONS; READOUT SYSTEMS; SI SEMICONDUCTOR DETECTORS; SIMULATION
- Descriptors DEC
- CALCULATION METHODS; CHARGED PARTICLES; ELEMENTARY PARTICLES; FERMIONS; HADRONS; IONS; MATHEMATICAL SOLUTIONS; MEASURING INSTRUMENTS; NUMERICAL SOLUTION; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.