Published September 2010
| Version v1
Journal article
XPS analysis technique and its preparation technique
Description
no abstract available
Additional details
Publishing Information
- Journal Title
- Kagaku Sochi
- Journal Volume
- 52
- Journal Issue
- 9
- Journal Page Range
- p. 64-68
- ISSN
- 0368-4849
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 43000515
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- No Abstract
- Descriptors DEI
- CHEMICAL STATE; ETCHING; INELASTIC SCATTERING; MEAN FREE PATH; PHYSICAL RADIATION EFFECTS; SAMPLE PREPARATION; SURFACE CLEANING; SURFACE PROPERTIES; TEMPERATURE GRADIENTS; X-RAY PHOTOELECTRON SPECTROSCOPY; X-RAY SOURCES
- Descriptors DEC
- CLEANING; ELECTRON SPECTROSCOPY; PHOTOELECTRON SPECTROSCOPY; RADIATION EFFECTS; RADIATION SOURCES; SCATTERING; SPECTROSCOPY; SURFACE FINISHING
Optional Information
- Notes
- 12 refs., 1 fig.