Published January 1, 2011 | Version v1
Journal article

Elastic characterization of Au thin films utilizing laser induced acoustic Rayleigh waves

  • 1. Ultrasonic Section, NDT Department, Soreq - Nuclear Research Center, Yavne 81800 (Israel)
  • 2. School of Physics and Astronomy, Faculty of Exact Sciences, Tel-Aviv University, Tel-Aviv 69978 (Israel)

Description

Wide frequency-band Rayleigh waves (∼100 MHz) were utilized to characterize the elastic constants of thin Au/Cr films deposited on glass substrates. The Rayleigh waves were excited utilizing laser induced thermoelastic mechanism and detected using a knife-edge technique apparatus. The dispersion of the signals in glass substrates coated with Au/Cr was measured and fitted to theory using a non-linear regression algorithm. From the fitting, the Au films Young modulus and the film thickness were extracted. The results were analyzed with regards to AFM scans performed on the samples and independent thickness measurement done by a dektak3 profiler. Results show a good agreement between the two measurements.

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/278/1/012005

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
278
Journal Issue
1
Journal Page Range
[4 p.]
ISSN
1742-6596

Conference

Title
2. international symposium on laser-ultrasonics - Science, technology and applications
Dates
5-8 Jul 2010
Place
Talence (France)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43044867
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALGORITHMS; ATOMIC FORCE MICROSCOPY; CHROMIUM; DISPERSIONS; GLASS; GOLD; LASER RADIATION; NONLINEAR PROBLEMS; RAYLEIGH WAVES; SUBSTRATES; THERMOELASTICITY; THICKNESS; THIN FILMS; YOUNG MODULUS
Descriptors DEC
DIMENSIONS; ELASTICITY; ELECTROMAGNETIC RADIATION; ELEMENTS; FILMS; MATHEMATICAL LOGIC; MECHANICAL PROPERTIES; METALS; MICROSCOPY; RADIATIONS; TRANSITION ELEMENTS