Development of spectrally selective imaging system for negative hydrogen ion source
Creators
- 1. National Institute for Fusion Science, 322-6 Oroshi, Toki, Gifu 509-5292 (Japan)
Description
A spectrally selective imaging system has been developed to obtain a distribution of Hα emissions at the extraction region in a hydrogen negative ion source. The diagnostic system consisted of an aspherical lens, optical filters, a fiber image conduit, and a charge coupled device detector was installed on the 1/3-scaled hydrogen negative ion source in the National Institute for Fusion Science. The center of sight line passes beside the plasma grid (PG) surface with the distance of 11 mm, and the viewing angle has coverage 35 mm from the PG surface. Two dimensional Hα distribution in the range up to 20 mm from the PG surface was clearly observed. The reduction area for Hα emission caused by beam extraction was widely distributed in the extraction region near the PG surface
Additional details
Identifiers
- DOI
- 10.1063/1.4842318;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 85
- Journal Issue
- 2
- Journal Page Range
- vp.
- ISSN
- 0034-6748
- CODEN
- RSINAK
Conference
- Title
- 14. international conference on ion sources
- Acronym
- ICIS 2011
- Dates
- 12-16 Sep 2011
- Place
- Giardini-Naxos, Sicily (Italy)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45075018
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AMINO ACIDS; ANIONS; BEAM EXTRACTION; CHARGE-COUPLED DEVICES; HYDROGEN IONS; IMAGE PROCESSING; IMAGES; ION BEAMS; OPTICAL FILTERS
- Descriptors DEC
- BEAMS; CARBOXYLIC ACIDS; CHARGED PARTICLES; FILTERS; IONS; ORGANIC ACIDS; ORGANIC COMPOUNDS; PROCESSING; SEMICONDUCTOR DEVICES
Optional Information
- Notes
- (c) 2013 AIP Publishing LLC