Published 1981
| Version v1
Report
Optimization of induced aberrations in ion optical systems
Description
The problem of designing an ion optical system with the minimum line width is addressed in this paper. The importance of the effects of the details of the first-order layout on the higher order aberrations is discussed. Procedures for minimizing the induced third and higher order aberrations are presented. We also present a technique for testing if these higher order aberrations are important when only second order intrinsic aberration matrices are available
Additional details
Publishing Information
- Imprint Title
- Workshop on high-resolution, large-acceptance spectrometers
- Journal Page Range
- p. IV D.1-IV D.24.
- Report number
- ANL/PHY--81-2
Conference
- Title
- Workshop on high-resolution, large-acceptance spectrometers.
- Dates
- 8 - 11 Sep 1981.
- Place
- Argonne, IL (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 14720092
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM OPTICS; CHROMATIC ABERRATIONS; COMPUTER CALCULATIONS; LINE WIDTHS; MAGNETIC SPECTROMETERS; MATRICES; OPTIMIZATION; RESOLUTION
- Descriptors DEC
- MEASURING INSTRUMENTS; SPECTROMETERS