Published June 1985
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Investigation of nonradiative recombination in semiconductors by photothermal displacement spectroscopy
Description
The dynamics of nonradiative recombination processes are investigated by measuring the thermal expansion and subsequent displacement of a sample surface caused by the absorption of a modulated laser beam. 6 refs., 3 figs
Availability note (English)
MF available from INIS under the Report Number; Available from NTIS, PC A02/MF A01 as DE86002882.
Files
Additional details
Publishing Information
- Imprint Pagination
- 6 p.
- Report number
- LBL--20190
Conference
- Title
- 4. international topical meeting on photoacoustic, thermal and related sciences.
- Dates
- 4-8 Aug 1985.
- Place
- Quebec (Canada).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 17029371
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- COPPER; EXPERIMENTAL DATA; GLASS; LASER RADIATION; MICHELSON INTERFEROMETER; P-TYPE CONDUCTORS; REACTION KINETICS; RECOMBINATION; SEMICONDUCTOR MATERIALS; SILICON; THERMAL EXPANSION
- Descriptors DEC
- DATA; ELECTROMAGNETIC RADIATION; ELEMENTS; EXPANSION; INFORMATION; INTERFEROMETERS; KINETICS; MATERIALS; MEASURING INSTRUMENTS; METALS; NUMERICAL DATA; RADIATIONS; SEMIMETALS; TRANSITION ELEMENTS
Optional Information
- Secondary number(s)
- CONF-850886--3.