Published December 15, 1988 | Version v1
Journal article Metadata-only

Silicon drift chamber prototype for the upgrade of the UA6 experiment at the CERN panti p collider

Creators

  • 1. Consiglio Nazionale delle Ricerche, Milan (Italy). Centro di Elettronica Quantistica e Strumentazione Elettronica
  • 2. Politecnico di Milano (Italy). Dipartimento di Elettronica
  • 3. Rockefeller Univ., New York (USA)
  • 4. Brookhaven National Lab., Upton, NY (USA)
  • 5. Technische Univ. Muenchen (Germany, F.R.). Fakultaet fuer Physik
  • 6. Max-Planck-Institut fuer Physik und Astrophysik, Muenchen (Germany, F.R.)
  • 7. European Organization for Nuclear Research, Geneva (Switzerland)

Description

A large-area (≅ 4x4 cm2) silicon drift chamber has been designed and constructed in order to investigate its possible use in the UA6 experiment. The drift chamber will supply unambiguously (x, y) space points on each track; each arm of the UA6 spectrometer could be provided with two layers of drift detectors. (orig.)

Additional details

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research, Section A
Journal Volume
273
Journal Issue
2/3
Series
Nucl. Instrum. Methods Phys. Res., Sect. A.
Journal Page Range
865-868
ISSN
0168-9002
CODEN
NIMAE

Conference

Title
London conference on position sensitive detectors.
Dates
7-11 Sep 1987.
Place
London (UK).

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
20023492
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANALOG-TO-DIGITAL CONVERTERS; BACKGROUND NOISE; CAPACITANCE; CERN SPS SYNCHROTRON; COLLIDING BEAMS; COUNTING CIRCUITS; FIELD EFFECT TRANSISTORS; PARTICLE TRACKS; POSITION SENSITIVE DETECTORS; PREAMPLIFIERS; SI SEMICONDUCTOR DETECTORS; TIME-TO-AMPLITUDE CONVERTERS
Descriptors DEC
ACCELERATORS; AMPLIFIERS; BEAMS; CYCLIC ACCELERATORS; ELECTRICAL PROPERTIES; ELECTRONIC CIRCUITS; ELECTRONIC EQUIPMENT; EQUIPMENT; MEASURING INSTRUMENTS; NOISE; PHYSICAL PROPERTIES; PULSE CONVERTERS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR DEVICES; SYNCHROTRONS; TRANSISTORS