Imprint of non-linear effects on HI intensity mapping on large scales
Creators
- 1. Department of Physics and Astronomy, University of the Western Cape, Cape Town 7535 (South Africa)
Description
Intensity mapping of the HI brightness temperature provides a unique way of tracing large-scale structures of the Universe up to the largest possible scales. This is achieved by using a low angular resolution radio telescopes to detect emission line from cosmic neutral Hydrogen in the post-reionization Universe. We use general relativistic perturbation theory techniques to derive for the first time the full expression for the HI brightness temperature up to third order in perturbation theory without making any plane-parallel approximation. We use this result and the renormalization prescription for biased tracers to study the impact of nonlinear effects on the power spectrum of HI brightness temperature both in real and redshift space. We show how mode coupling at nonlinear order due to nonlinear bias parameters and redshift space distortion terms modulate the power spectrum on large scales. The large scale modulation may be understood to be due to the effective bias parameter and effective shot noise.
Availability note (English)
Available from http://dx.doi.org/10.1088/1475-7516/2017/06/005Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Cosmology and Astroparticle Physics
- Journal Volume
- 2017
- Journal Issue
- 06
- Journal Page Range
- p. 005
- ISSN
- 1475-7516
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49022956
- Subject category
- S79: ASTROPHYSICS, COSMOLOGY AND ASTRONOMY;
- Descriptors DEI
- APPROXIMATIONS; BRIGHTNESS; COUPLING; DISTURBANCES; EMISSION; HYDROGEN; MODULATION; NONLINEAR PROBLEMS; PERTURBATION THEORY; RADIO TELESCOPES; RED SHIFT; RELATIVISTIC RANGE; RENORMALIZATION; RESOLUTION; SPACE; SPECTRA; UNIVERSE
- Descriptors DEC
- ANTENNAS; CALCULATION METHODS; ELECTRICAL EQUIPMENT; ELECTRONIC EQUIPMENT; ELEMENTS; ENERGY RANGE; EQUIPMENT; NONMETALS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIO EQUIPMENT; TELESCOPES