Relation between the oxidation mechanism of nickel, the microstructure and mechanical resistance of NiO films and the nickel purity
Creators
- 1. LEMHE, CNRS UMR 8647, Universite Paris XI, Centre d'Orsay, F-91405 Orsay (France)
- 2. ENSMP, Centre des Materiaux, CNRS UMR 7633, BP 87, F-91003 Evry (France)
Description
The effect of impurities on the oxidation mechanism of nickel and on the mechanical characteristics of NiO films was studied on two industrial nickel grades compared to a pure nickel. In this part, influence of impurities on the oxidation mechanism and on the NiO film microstructure will be detailed. The oxidation mechanism, especially studied at 800 deg. C in air, was clarified using complementary techniques, SEM and STEM microstructural and analytical investigations, XPS analyses, profilometry, oxygen isotopic exchange and SIMS. Depending on the Ni purity, the morphology of the oxide scale and the porosity amount differs. Duplex oxide layers and internal oxidation are observed on industrial grades, while a simple NiO film grows on pure nickel without internal oxidation. An oxidation mechanism, which differs according to the presence or not of impurities in the nickel substrate, is proposed. The mechanical characteristics will be characterised and discussed in the following paper (part II) in relation with the microstructural modifications induced by changing the nickel purity
Additional details
Identifiers
- DOI
- 10.1016/j.msea.2005.08.225;
- PII
- S0921-5093(05)01166-4;
Publishing Information
- Journal Title
- Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
- Journal Volume
- 415
- Journal Issue
- 1-2
- Journal Page Range
- p. 21-32
- ISSN
- 0921-5093
- CODEN
- MSAPE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38076303
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- FILMS; IMPURITIES; ION MICROPROBE ANALYSIS; ISOTOPIC EXCHANGE; LAYERS; MASS SPECTROSCOPY; MICROSTRUCTURE; MORPHOLOGY; NICKEL; NICKEL OXIDES; OXIDATION; POROSITY; SCANNING ELECTRON MICROSCOPY; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL ANALYSIS; CHEMICAL REACTIONS; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTS; METALS; MICROANALYSIS; MICROSCOPY; NICKEL COMPOUNDS; NONDESTRUCTIVE ANALYSIS; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; SPECTROSCOPY; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.