Published July 2011 | Version v1
Journal article

Oxygen-induced reduction of the graphitization temperature of SiC surface

  • 1. Tohoku Univ., Research Inst. of Electrical Communications, Sendai, Miyagi (Japan)
  • 2. Hirosaki Univ., Faculty of Science and Technology, Hirosaki, Aomori (Japan)
  • 3. Japan Atomic Energy Agency, Sayo, Hyogo (Japan)

Description

In the solid-vapor phase equilibria between SiC and O2 system, there exists a region where the reaction (2+x)SiC+O2→(2+x)Si↑+2CO↑+xC↓ takes place. By tuning the temperature and the oxygen pressure used in the graphitization annealing into this region, we have succeeded in the growth of epitaxial graphene on SiC crystals at 1000degC, which is lower, by 250degC or more, than the conventional epitaxial graphene method. The method is especially useful to formation of epitaxial graphene on silicon (GOS), which requires a lower graphitization temperature because of the Si substrate as well as of its mission to attain compatibility with Si technology. (author)

Availability note (English)

Available from http://dx.doi.org/10.1143/JJAP.50.070105

Additional details

Identifiers

Publishing Information

Journal Title
Japanese Journal of Applied Physics
Journal Volume
50
Journal Issue
7,pt.1
Journal Page Range
p. 070105.1-070105.5
ISSN
0021-4922

Optional Information

Notes
10 refs., 6 figs.