Published July 2011
| Version v1
Journal article
Oxygen-induced reduction of the graphitization temperature of SiC surface
Creators
- 1. Tohoku Univ., Research Inst. of Electrical Communications, Sendai, Miyagi (Japan)
- 2. Hirosaki Univ., Faculty of Science and Technology, Hirosaki, Aomori (Japan)
- 3. Japan Atomic Energy Agency, Sayo, Hyogo (Japan)
Description
In the solid-vapor phase equilibria between SiC and O2 system, there exists a region where the reaction (2+x)SiC+O2→(2+x)Si↑+2CO↑+xC↓ takes place. By tuning the temperature and the oxygen pressure used in the graphitization annealing into this region, we have succeeded in the growth of epitaxial graphene on SiC crystals at 1000degC, which is lower, by 250degC or more, than the conventional epitaxial graphene method. The method is especially useful to formation of epitaxial graphene on silicon (GOS), which requires a lower graphitization temperature because of the Si substrate as well as of its mission to attain compatibility with Si technology. (author)
Availability note (English)
Available from http://dx.doi.org/10.1143/JJAP.50.070105Additional details
Identifiers
Publishing Information
- Journal Title
- Japanese Journal of Applied Physics
- Journal Volume
- 50
- Journal Issue
- 7,pt.1
- Journal Page Range
- p. 070105.1-070105.5
- ISSN
- 0021-4922
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 43020276
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANNEALING; EPITAXY; GRAPHITIZATION; OXYGEN; REDUCTION; SILICON; SILICON CARBIDES; SOFT X RADIATION; SPRING-8 STORAGE RING; SUBSTRATES; SURFACES
- Descriptors DEC
- CARBIDES; CARBON COMPOUNDS; CHEMICAL REACTIONS; CRYSTAL GROWTH METHODS; ELECTROMAGNETIC RADIATION; ELEMENTS; HEAT TREATMENTS; IONIZING RADIATIONS; NONMETALS; RADIATION SOURCES; RADIATIONS; SEMIMETALS; SILICON COMPOUNDS; STORAGE RINGS; SYNCHROTRON RADIATION SOURCES; X RADIATION
Optional Information
- Notes
- 10 refs., 6 figs.